Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures"
Date Available
2016-04-01Type
datasetData Creator
Murray, JeremyPublisher
University of Edinburgh, School of EngineeringMetadata
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Citation
Murray, Jeremy. (2016). Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures", [dataset]. University of Edinburgh, School of Engineering. https://doi.org/10.7488/ds/1337.
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